Experimental-numerical technique to evaluate the thickness of tin thin film
In this study, the numerical analysis of instrumented indentation testing was combined with the experimental procedure to evaluate the mechanical properties and thickness of a titanium nitride (TiN) film deposited on titanium substrate (Ti) by plasma processing. TiN film thickness is an important pa...
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ri-123456789-454452021-12-17T12:16:46Z Experimental-numerical technique to evaluate the thickness of tin thin film Dias, Avelino Manuel da Silva Silva, Everton Carneiro da Libório, Maxwell Santana experimental-numerical analysis tin film indentation testing film thickness FEM In this study, the numerical analysis of instrumented indentation testing was combined with the experimental procedure to evaluate the mechanical properties and thickness of a titanium nitride (TiN) film deposited on titanium substrate (Ti) by plasma processing. TiN film thickness is an important parameter for the surface treatment industry. In numerical analysis, the finite elements method (FEM) was applied using Marc™ commercial software. Initially, the mechanical properties of the film and substrate were determined using a numerical-experimental methodology, combining the results of indentation testing with a Berkovich indenter and the same numerical simulation for both the film and substrate. Next, the behavior of instrumented Vickers hardness as a function of maximum indenter penetration depth (hmax) was compared with the numerical results of this hardness as a function of the ratio between penetration depth and film thickness (hmax/t). Both curves were fitted using power law equations, which calculated film thickness applying a new convergence algorithm. Finally, it also was shown that the film thickness obtained agrees with the experimental range reported in the literature. 2021-12-17T12:16:46Z 2021-12-17T12:16:46Z 2019 article DIAS, Avelino Manuel da Silva; SILVA, Everton Carneiro da; LIBÓRIO, Maxwell Santana. Experimental-numerical technique to evaluate the thickness of tin thin film. Materials Research, [S.l.], v. 22, n. 5, p. 1-7, set. 2019. FapUNIFESP (SciELO). Disponível em: https://www.scielo.br/scielo.php?script=sci_abstract&pid=S1516-14392019000500201&lng=en&nrm=iso&tlng=en. Acesso em: 28 set. 2021. DOI: http://dx.doi.org/10.1590/1980-5373-mr-2018-0283. 1516-1439 1980-5373 https://repositorio.ufrn.br/handle/123456789/45445 http://dx.doi.org/10.1590/1980-5373-mr-2018-0283 en Attribution 3.0 Brazil http://creativecommons.org/licenses/by/3.0/br/ application/pdf Materials Research |
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experimental-numerical analysis tin film indentation testing film thickness FEM Dias, Avelino Manuel da Silva Silva, Everton Carneiro da Libório, Maxwell Santana Experimental-numerical technique to evaluate the thickness of tin thin film |
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In this study, the numerical analysis of instrumented indentation testing was combined with the experimental procedure to evaluate the mechanical properties and thickness of a titanium nitride (TiN) film deposited on titanium substrate (Ti) by plasma processing. TiN film thickness is an important parameter for the surface treatment industry. In numerical analysis, the finite elements method (FEM) was applied using Marc™ commercial software. Initially, the mechanical properties of the film and substrate were determined using a numerical-experimental methodology, combining the results of indentation testing with a Berkovich indenter and the same numerical simulation for both the film and substrate. Next, the behavior of instrumented Vickers hardness as a function of maximum indenter penetration depth (hmax) was compared with the numerical results of this hardness as a function of the ratio between penetration depth and film thickness (hmax/t). Both curves were fitted using power law equations, which calculated film thickness applying a new convergence algorithm. Finally, it also was shown that the film thickness obtained agrees with the experimental range reported in the literature. |
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article |
author |
Dias, Avelino Manuel da Silva Silva, Everton Carneiro da Libório, Maxwell Santana |
author_facet |
Dias, Avelino Manuel da Silva Silva, Everton Carneiro da Libório, Maxwell Santana |
author_sort |
Dias, Avelino Manuel da Silva |
title |
Experimental-numerical technique to evaluate the thickness of tin thin film |
title_short |
Experimental-numerical technique to evaluate the thickness of tin thin film |
title_full |
Experimental-numerical technique to evaluate the thickness of tin thin film |
title_fullStr |
Experimental-numerical technique to evaluate the thickness of tin thin film |
title_full_unstemmed |
Experimental-numerical technique to evaluate the thickness of tin thin film |
title_sort |
experimental-numerical technique to evaluate the thickness of tin thin film |
publisher |
Materials Research |
publishDate |
2021 |
url |
https://repositorio.ufrn.br/handle/123456789/45445 http://dx.doi.org/10.1590/1980-5373-mr-2018-0283 |
work_keys_str_mv |
AT diasavelinomanueldasilva experimentalnumericaltechniquetoevaluatethethicknessoftinthinfilm AT silvaevertoncarneiroda experimentalnumericaltechniquetoevaluatethethicknessoftinthinfilm AT liboriomaxwellsantana experimentalnumericaltechniquetoevaluatethethicknessoftinthinfilm |
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1773963351125131264 |