Annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films
We systematically investigate the annealing effects on the microwave linewidth broadening of FeCuNbSiB ferromagnetic films with thickness of 100 nm. We correlate the non-uniform residual stress obtained from grazing incidence x-ray diffraction measurements with the ferromagnetic resonance (FMR) line...
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| Principais autores: | , , , |
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| Formato: | article |
| Idioma: | English |
| Publicado em: |
AIP Publishing LLC
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| Endereço do item: | https://repositorio.ufrn.br/handle/123456789/45036 |
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