Caracterização via fluorescência de raios-X e difração de raios-X da liga AA7050 consolidada sob diferentes temperaturas de extrusão
The objective of this work was to evaluate the influence of the extrusion temperature in the phases present in aluminum alloys AA7050 through the techniques of X-Ray Fluorescence (XRF) and X-Ray Diffraction (XRD). The raw material originated from the recycling of chips from the AA7050 T7451 aeronaut...
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| Format: | bachelorThesis |
| Jezik: | pt_BR |
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Universidade Federal do Rio Grande do Norte
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| Online pristup: | https://repositorio.ufrn.br/handle/123456789/34006 |
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