Threshold for reorientation of the magnetization in F/AF bilayers
We study reorientation of magnetization of a ferromagnetic film grown on a compensated antiferromagnetic substrate and propose a method to determine a lower bound of the interface exchange coupling strength. For uniaxial ferromagnetic films, we show that the frustration induced by the interface exc...
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| Principais autores: | , , |
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| Formato: | article |
| Idioma: | English |
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| Endereço do item: | https://repositorio.ufrn.br/jspui/handle/123456789/28809 https://doi.org/10.1016/j.jmmm.2004.11.315 |
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