Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects

Thin films of perovskite-type materials such as PbTiO3, BaTiO3, (Pb,La)TiO3, (Pb, La)(Zr,Ti)O3, KNbO3, and Pb(Mg,Nb)O3 have been attracting great interest for applications like non-volatile memories, ultrasonic sensors and optical devices. Thin film should be epitaxially grown or at least highly tex...

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Principais autores: Rangel, J. Horta G., Bernardi, Maria Inês Basso, Paskocimas, Carlos Alberto, Silva, Elson Longo da, Varela, José A.
Formato: article
Idioma:English
Publicado em: Elsevier
Assuntos:
Chemical synthesis
Thin films
Optical properties
Rocking curve
Endereço do item:https://repositorio.ufrn.br/handle/123456789/32255
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spelling ri-123456789-322552022-01-12T15:15:40Z Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects Rangel, J. Horta G. Bernardi, Maria Inês Basso Paskocimas, Carlos Alberto Silva, Elson Longo da Varela, José A. Chemical synthesis Thin films Optical properties Rocking curve Thin films of perovskite-type materials such as PbTiO3, BaTiO3, (Pb,La)TiO3, (Pb, La)(Zr,Ti)O3, KNbO3, and Pb(Mg,Nb)O3 have been attracting great interest for applications like non-volatile memories, ultrasonic sensors and optical devices. Thin film should be epitaxially grown or at least highly textured since the properties of this anisotropic material depend on the crystallographic orientation. For optical devices, in particular, an epitaxial thin film without defects are essential to reduce optical propagation losses. Pb1 − xLaxTiO3 (PLT) where x=0, 13 and 27% thin films were prepared by a chemical method (polymeric precursors method), and deposited by the spin coating technique onto substrates of SrTiO3 (STO) and LaAlO3 (LAO). The films were then heat treated at 500 °C in a controlled atmosphere of O2. The orientation degree of the thin films was obtained from rocking curve technique, by means of X-ray diffraction analysis. A microstructural study revealed that the films were crack-free, homogeneous and have low roughness 2021-04-16T17:45:45Z 2021-04-16T17:45:45Z 2007-04-02 article RANGEL, J.H.G.; BERNARDI, M.I.B.; PASKOCIMAS, C.A.; LONGO, E.; VARELA, J.A.. Study on the orientation degree of Pb1−xLaxTiO3 thin films by the rocking curve technique and its morphological aspects. Surface and Coatings Technology, [S.L.], v. 201, n. 14, p. 6345-6351, abr. 2007. Disponível em: https://www.sciencedirect.com/science/article/abs/pii/S0257897206014642?via%3Dihub. Acesso em: 12 mar. 2021. http://dx.doi.org/10.1016/j.surfcoat.2006.11.039. 0257-8972 https://repositorio.ufrn.br/handle/123456789/32255 10.1016/j.surfcoat.2006.11.039. en Attribution 3.0 Brazil http://creativecommons.org/licenses/by/3.0/br/ application/pdf Elsevier
institution Repositório Institucional
collection RI - UFRN
language English
topic Chemical synthesis
Thin films
Optical properties
Rocking curve
spellingShingle Chemical synthesis
Thin films
Optical properties
Rocking curve
Rangel, J. Horta G.
Bernardi, Maria Inês Basso
Paskocimas, Carlos Alberto
Silva, Elson Longo da
Varela, José A.
Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects
description Thin films of perovskite-type materials such as PbTiO3, BaTiO3, (Pb,La)TiO3, (Pb, La)(Zr,Ti)O3, KNbO3, and Pb(Mg,Nb)O3 have been attracting great interest for applications like non-volatile memories, ultrasonic sensors and optical devices. Thin film should be epitaxially grown or at least highly textured since the properties of this anisotropic material depend on the crystallographic orientation. For optical devices, in particular, an epitaxial thin film without defects are essential to reduce optical propagation losses. Pb1 − xLaxTiO3 (PLT) where x=0, 13 and 27% thin films were prepared by a chemical method (polymeric precursors method), and deposited by the spin coating technique onto substrates of SrTiO3 (STO) and LaAlO3 (LAO). The films were then heat treated at 500 °C in a controlled atmosphere of O2. The orientation degree of the thin films was obtained from rocking curve technique, by means of X-ray diffraction analysis. A microstructural study revealed that the films were crack-free, homogeneous and have low roughness
format article
author Rangel, J. Horta G.
Bernardi, Maria Inês Basso
Paskocimas, Carlos Alberto
Silva, Elson Longo da
Varela, José A.
author_facet Rangel, J. Horta G.
Bernardi, Maria Inês Basso
Paskocimas, Carlos Alberto
Silva, Elson Longo da
Varela, José A.
author_sort Rangel, J. Horta G.
title Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects
title_short Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects
title_full Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects
title_fullStr Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects
title_full_unstemmed Study on the orientation degree of Pb1 − xLaxTiO3 thin films by the rocking curve technique and its morphological aspects
title_sort study on the orientation degree of pb1 − xlaxtio3 thin films by the rocking curve technique and its morphological aspects
publisher Elsevier
publishDate 2021
url https://repositorio.ufrn.br/handle/123456789/32255
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