Model-based testing for embedded systems /

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Principais autores: Zander, Justyna, Schieferdecker, Ina, Mosterman, Pieter J.
Formato: Livro
Publicado em:
Assuntos:
Sistemas informáticos incorporados -
Teste.
Endereço do item:https://app.bczm.ufrn.br/home/#/item/208765
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spelling oai:localhost:123456789-2141862022-12-01T03:46:02Z Model-based testing for embedded systems / Zander, Justyna Schieferdecker, Ina Mosterman, Pieter J. Sistemas informáticos incorporados - Teste. 10 2022-10-11T19:35:31Z 2022-10-11T19:35:31Z c2012. Livro 004.031.6 M689 9781439818459 (hardcover : alk. paper)#$&1439818452 (hardcover : alk. paper) 208765 https://app.bczm.ufrn.br/home/#/item/208765 https://app.bczm.ufrn.br/home/#/item/208765
institution Acervo SISBI
collection SIGAA
topic Sistemas informáticos incorporados -
Teste.
spellingShingle Sistemas informáticos incorporados -
Teste.
Zander, Justyna
Schieferdecker, Ina
Mosterman, Pieter J.
Model-based testing for embedded systems /
description
format Livro
author Zander, Justyna
Schieferdecker, Ina
Mosterman, Pieter J.
author_facet Zander, Justyna
Schieferdecker, Ina
Mosterman, Pieter J.
author_sort Zander, Justyna
title Model-based testing for embedded systems /
title_short Model-based testing for embedded systems /
title_full Model-based testing for embedded systems /
title_fullStr Model-based testing for embedded systems /
title_full_unstemmed Model-based testing for embedded systems /
title_sort model-based testing for embedded systems /
publishDate 2022
url https://app.bczm.ufrn.br/home/#/item/208765
work_keys_str_mv AT zanderjustyna modelbasedtestingforembeddedsystems
AT schieferdeckerina modelbasedtestingforembeddedsystems
AT mostermanpieterj modelbasedtestingforembeddedsystems
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